J750

  • Teradyne Unveils Cutting-Edge Semiconductor Test Solutions at IESA Vision Summit

    Teradyne will showcase advanced semiconductor test solutions, including UltraFLEX, UltraFLEXplus, J750, and ETS Platform, at the IESA Vision Summit 2026 in Bengaluru. These solutions aim to boost throughput, performance, and cost-efficiency for complex testing needs. Teradyne’s President will also deliver a keynote and participate in a panel discussing India’s semiconductor manufacturing future.

    4 hours ago